Transmission electron microscope (TEM) 1002202-209
A type of microscope in which an electron beam is focused on the
specimen and images are formed by the transmitting of the electron beam in a way of geometrical
Since electron beam wavelengths are short, TEM can obtain high
magnification and high resolution images that cannot be obtained with an ordinary optical microscope.
Image contrasts are formed by the intensity of scattering of the electrons at each part of the
specimen. Resolution of recent TEM reaches 0.2 nm to 0.3 nm, which is close to the theoretical
Scanning electron microscope (SEM)